SN74ABT8652DW
Manufacturer
Texas Instruments
Description
IC SCAN TEST DEVICE 28-SOIC Scan Test Device with Bus Transceiver and Registers IC 28-SOIC
Product Attributes
Type
Case/Package
Direction
Height
Lead Free
Length
Lifecycle Status
Logic Function
Manufacturer Lifecycle Status
Max Operating Temperature
Max Supply Voltage
Min Operating Temperature
Min Supply Voltage
Mount
Number of Bits
Number of Channels
Number of Circuits
Number of Elements
Number of Outputs
Number of Pins
Polarity
Propagation Delay
Quiescent Current
Radiation Hardening
REACH SVHC
RoHS
Thickness
Turn-On Delay Time
Weight
Width
Description
SOIC
Bidirectional
2.65 mm
Lead Free
17.9 mm
Production (Last Updated: 3 days ago)
AND, Transceiver
ACTIVE (Last Updated: 3 days ago)
85 °C
5.5 V
-40 °C
4.5 V
Surface Mount
8
8
1
1
8
28
Non-Inverting
5.3 ns
30 mA
No
No
Compliant
2.35 mm
13.5 ns
730.794007 mg
7.5 mm
In Stock
Quantity
MOQ : Unavailable
Per Unit Price
₹Infinity
Total Price
₹Infinity
Ships in 7-10 days from Bengaluru
Product Attributes
Type
Case/Package
Direction
Height
Lead Free
Length
Lifecycle Status
Logic Function
Manufacturer Lifecycle Status
Max Operating Temperature
Max Supply Voltage
Min Operating Temperature
Min Supply Voltage
Mount
Number of Bits
Number of Channels
Number of Circuits
Number of Elements
Number of Outputs
Number of Pins
Polarity
Propagation Delay
Quiescent Current
Radiation Hardening
REACH SVHC
RoHS
Thickness
Turn-On Delay Time
Weight
Width
Description
SOIC
Bidirectional
2.65 mm
Lead Free
17.9 mm
Production (Last Updated: 3 days ago)
AND, Transceiver
ACTIVE (Last Updated: 3 days ago)
85 °C
5.5 V
-40 °C
4.5 V
Surface Mount
8
8
1
1
8
28
Non-Inverting
5.3 ns
30 mA
No
No
Compliant
2.35 mm
13.5 ns
730.794007 mg
7.5 mm
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